Accession Number:

ADA135705

Title:

Reliability Modeling of Critical Electronic Devices.

Descriptive Note:

Final technical rept. Oct 81-Jan 83,

Corporate Author:

IIT RESEARCH INST CHICAGO IL

Personal Author(s):

Report Date:

1983-05-01

Pagination or Media Count:

374.0

Abstract:

This report presents failure rate prediction procedures for magnetrons, vidicons, cathode ray tubes, semiconductor lasers, helium-cadmium lasers, helium-neon lasers, NdYAG lasers, electronic filters, solid state relays, time delay relays electronic hybrid, circuit breakers, I.C. Sockets, thumbwheel switches, electromagnetic meters, fuses, crystals, incandescent lamps, neon glow lamps and surface acoustic wave devices. Collected field failure rate data were utilized to develop and evaluate the procedures. The reliability prediction procedures are presented in a form compatible with MIL-HDBK-217. Author

Subject Categories:

  • Line, Surface and Bulk Acoustic Wave Devices
  • Electrooptical and Optoelectronic Devices
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE