Analysis of Fin-Lines with the Finite Metallization Thickness.
Interim technical rept.,
ILLINOIS UNIV AT URBANA ELECTROMAGNETICS LAB
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In this paper, we present a method for analyzing fin-line structures with finite metallization thicknesses. The method, although it is based on a hybrid mode formulation, by-passes the lengthy process of formulating the determinantal equation for the unknown propagation constant. Some numerical results are presented to show the effect of the metallization thickness for unilateral and bilateral fin lines. Author
- Electrical and Electronic Equipment