Accession Number:

ADA133491

Title:

Analog Fault Diagnosis of Large-Scale Electronic Circuits.

Descriptive Note:

Final rept. 1 Jun 78-13 May 82,

Corporate Author:

NOTRE DAME UNIV IN DEPT OF ELECTRICAL ENGINEERING

Personal Author(s):

• Liu,Ruey-wen

Report Date:

1983-08-01

Pagination or Media Count:

166.0

Abstract:

The long-term objective of this research is to develop a practical and reliable Automatic Test Program Generator ATPG which will allow us to locate the faulty components of a large analog circuit when it is faulty. The short-term objective is to search for viable and amenable concepts under which long-term objectives can be achieved. During this short period, some significant progress has been made.

Descriptors:

• *Test methods
• *Analog systems
• *Faults
• *Circuits
• Electronics
• Feedback
• Frequency response
• Time domain
• Noise
• Automation

Subject Categories:

• Electrical and Electronic Equipment
• Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE