Analog Fault Diagnosis of Large-Scale Electronic Circuits.
Final rept. 1 Jun 78-13 May 82,
NOTRE DAME UNIV IN DEPT OF ELECTRICAL ENGINEERING
Pagination or Media Count:
The long-term objective of this research is to develop a practical and reliable Automatic Test Program Generator ATPG which will allow us to locate the faulty components of a large analog circuit when it is faulty. The short-term objective is to search for viable and amenable concepts under which long-term objectives can be achieved. During this short period, some significant progress has been made.
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods