Accession Number:

ADA129223

Title:

Development and Application of SIMS (Secondary Ion Mass Spectrometry) Characterization Techniques for the Study of Impurities and Impurity Motion in HgCdTe and CdTe

Descriptive Note:

Semiannual technical rept. 1 Nov 1982-1 May 1983

Corporate Author:

EVANS (CHARLES) AND ASSOCIATES SAN MATEO CA

Personal Author(s):

Report Date:

1983-05-01

Pagination or Media Count:

11.0

Abstract:

The broad objectives of this program are to develop quantitative analytical procedures for the application of high performance Secondary Ion Mass Spectrometry SIMS to the analysis of CdTe and HgCdTe for trace element and major constituent characterization, particularly Hg, and to perform materials- directed research in order to better understand the incorporation and redistribution of impurity elements in CdTe and HgCdTe.

Subject Categories:

  • Inorganic Chemistry
  • Electricity and Magnetism
  • Atomic and Molecular Physics and Spectroscopy
  • Particle Accelerators
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE