Accession Number:

ADA129172

Title:

Study of Electronic Transport and Breakdown in Thin Insulating Films

Descriptive Note:

Semi-annual technical rept. no. 3

Corporate Author:

PRINCETON UNIV NJ DEPT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE

Personal Author(s):

Report Date:

1977-06-01

Pagination or Media Count:

67.0

Abstract:

Recent progress is reported in an ongoing of studies of high-field charge-carrier injection, transport, trapping, and dielectric breakdown in thin insulating films. The investigations reported here include the generation of interface states in the Si-Si02 system by ionizing radiation and by high-field stress, the high-field generation of electron traps in Si02, a method for measuring interface-state densities at low temperatures, and studies of high- field effects in the A1203-Si system.

Subject Categories:

  • Electricity and Magnetism
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE