Study of Electronic Transport and Breakdown in Thin Insulating Films
Semi-annual technical rept. no. 3
PRINCETON UNIV NJ DEPT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE
Pagination or Media Count:
Recent progress is reported in an ongoing of studies of high-field charge-carrier injection, transport, trapping, and dielectric breakdown in thin insulating films. The investigations reported here include the generation of interface states in the Si-Si02 system by ionizing radiation and by high-field stress, the high-field generation of electron traps in Si02, a method for measuring interface-state densities at low temperatures, and studies of high- field effects in the A1203-Si system.
- Electricity and Magnetism
- Solid State Physics