Accession Number:

ADA128672

Title:

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume V. Design for Testability.

Descriptive Note:

Final rept.,

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP

Personal Author(s):

Report Date:

1982-10-01

Pagination or Media Count:

68.0

Abstract:

Designing for testability if needed to reduce costs associated with testing and maintaining electronic systems. Two approaches are considered 1 modification of established circuits and 2 general design of new circuits where testability is a major consideration. Computer programs TMEAS and SCOAP, developed for evaluating testability in established circuits, are discussed. In the design of new circuits only a few techniques are known that yield highly testable circuits without sacrificing other desirable traits, two, IBMs LSSD method and bit slicing, are discussed. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Hardware
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE