State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume V. Design for Testability.
AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP
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Designing for testability if needed to reduce costs associated with testing and maintaining electronic systems. Two approaches are considered 1 modification of established circuits and 2 general design of new circuits where testability is a major consideration. Computer programs TMEAS and SCOAP, developed for evaluating testability in established circuits, are discussed. In the design of new circuits only a few techniques are known that yield highly testable circuits without sacrificing other desirable traits, two, IBMs LSSD method and bit slicing, are discussed. Author
- Electrical and Electronic Equipment
- Computer Hardware
- Test Facilities, Equipment and Methods