Accession Number:

ADA128019

Title:

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VIII. Fault Simulation.

Descriptive Note:

Final rept.,

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP

Personal Author(s):

Report Date:

1982-10-01

Pagination or Media Count:

27.0

Abstract:

Fault simulation is widely used by industry in such applications as scoring the fault coverage of test sequences and construction of fault dictionaries. For use in testing VLSI circuits a simulator is evaluated by its accuracy i.e. modelling capability. To be accurate simulators must employ multi-valued logic in order to represent unknown signal values, impedance, signal transitions etc, circuit delays such as transport risefall, inertial, and the fault modes it is capable of handling. Of the three basic fault simulators now in use parallel, deductive and concurrent concurrent fault simulation appears most promising. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE