State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume IV. Test Generation.
AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP
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Two major approaches are considered for generating tests for digital systems methods based on detailed circuit models of the unit under test UUT and methods based primarily on a functional description of the UUT. In addition to test generation of general digital systems, the testing requirements of microprocessors, semiconductor memories and PLA are examined. The D-algorithm and several variants are discussed as a basis for practical test generation procedures. Author
- Electrical and Electronic Equipment
- Computer Programming and Software
- Computer Hardware