Accession Number:

ADA127985

Title:

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume IV. Test Generation.

Descriptive Note:

Final rept.,

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP

Personal Author(s):

Report Date:

1982-10-01

Pagination or Media Count:

67.0

Abstract:

Two major approaches are considered for generating tests for digital systems methods based on detailed circuit models of the unit under test UUT and methods based primarily on a functional description of the UUT. In addition to test generation of general digital systems, the testing requirements of microprocessors, semiconductor memories and PLA are examined. The D-algorithm and several variants are discussed as a basis for practical test generation procedures. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Programming and Software
  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE