Accession Number:

ADA127984

Title:

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume I. Executive Summary.

Descriptive Note:

Final rept.,

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA ENGINEERING GROUP

Personal Author(s):

Report Date:

1982-10-01

Pagination or Media Count:

24.0

Abstract:

This project is a two-phase study dealing with testing and testability of custom LSIVLSI circuits. The tasks summarized and evaluated in this report consisted of compiling and documenting a survey and assessment of the state-of-the-art for each of seven topics. Each of these topics has resulted in a formal report and are listed below Vol. 2 Hardware Design Verification Vol. 3 Fault Mode Analysis Vol. 4 Test Generation Vol. 5 Design for Testability Vol. 6 Redundancy, Testing Circuits, and Codes Vol. 7 Built-in Testing BIT and Built-in Test Equipment BITE and Vol. 8 Fault Simulation.

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE