Accession Number:

ADA121014

Title:

Technical Reliability Studies. EOS/ESD Technology Abstracts

Descriptive Note:

Corporate Author:

RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY

Personal Author(s):

• Denson, William K.
• Farrell, John P.

Report Date:

1982-01-01

Pagination or Media Count:

284.0

Abstract:

The EOSESD Technology Abstracts is a bibliography of approximately 400 papers, reports and articles related to the subject of electrical overstresselectrostatic discharge. The intent of this bibliography is to make more accessible the present information on the subject of EOSESD, such as design, failure analysis, protective measures and techniques, and training programs. The cut-off date for inclusion of material was March, 1982. The 400 abstracts represent a 50 increase in content over TRS-3.

Descriptors:

• *ABSTRACTS
• *MEMORY DEVICES
• *MICROCIRCUITS
• *SEMICONDUCTORS
• *TEST METHODS
• ELECTRIC DISCHARGES
• FAILURE(ELECTRONICS)
• LIFE TESTS
• METHODOLOGY
• PREDICTIONS
• PROTECTION
• RELIABILITY(ELECTRONICS)
• TRAINING

Subject Categories:

• Information Science
• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE