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Accession Number:
ADA113994
Title:
Technical Reliability Studies. EOS/ESD Technology Abstracts
Descriptive Note:
Corporate Author:
RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY
Report Date:
1981-01-01
Pagination or Media Count:
138.0
Abstract:
The EOSESD Technology Abstracts references literature pertinent to Electrical Overstress and Electrostatic Discharge damage or degradation of electronic devices. Aspects encompass design, failure analysis, protective measures and techniques, and training programs.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE