Accession Number:

ADA113994

Title:

Technical Reliability Studies. EOS/ESD Technology Abstracts

Descriptive Note:

Corporate Author:

RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY

Personal Author(s):

• Kraeger, Eugene
• Grimaldi, Wayne

Report Date:

1981-01-01

Pagination or Media Count:

138.0

Abstract:

The EOSESD Technology Abstracts references literature pertinent to Electrical Overstress and Electrostatic Discharge damage or degradation of electronic devices. Aspects encompass design, failure analysis, protective measures and techniques, and training programs.

Descriptors:

• *ELECTRONIC EQUIPMENT
• *RELIABILITY(ELECTRONICS)
• *STATIC DISCHARGERS
• ABSTRACTS
• DAMAGE
• DEGRADATION
• ELECTRIC DISCHARGES
• FAILURE(ELECTRONICS)
• LITERATURE SURVEYS
• PROTECTION
• REPORTS
• STRESSES

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE