Accession Number:
ADA113994
Title:
Technical Reliability Studies. EOS/ESD Technology Abstracts
Descriptive Note:
Corporate Author:
RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY
Personal Author(s):
Report Date:
1981-01-01
Pagination or Media Count:
138.0
Abstract:
The EOSESD Technology Abstracts references literature pertinent to Electrical Overstress and Electrostatic Discharge damage or degradation of electronic devices. Aspects encompass design, failure analysis, protective measures and techniques, and training programs.
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems