Accession Number:

ADA106068

Title:

Analytical Investigation of Neutron Hardening of Integrated Injection Logic.

Descriptive Note:

Final rept. 28 Jan-11 Jul 80,

Corporate Author:

MISSION RESEARCH CORP ALBUQUERQUE NM

Personal Author(s):

Report Date:

1980-07-11

Pagination or Media Count:

36.0

Abstract:

An analytical technique is presented for investigating the neutron induced degradation of integrated injection logic I2L inverter cells as a function of basic processing variables. The technique combines a one-dimensional semiconductor device code, the PN code, with the circuit analysis code SPICE. Predictions of neutron induced degradation as a function of npn transistor base doping, epitaxial thickness and resistivity and pnp transistor base width are presented for a second generation I2L technology. A comparison of predicted response to experimental data is given for inverter cells fabricated with different npn base doping and epitaxial thickness. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Nuclear Radiation Shielding, Protection and Safety

Distribution Statement:

APPROVED FOR PUBLIC RELEASE