Accession Number:

ADA102233

Title:

On the Sequential Diagnosibility of a Class of Digital Systems,

Descriptive Note:

Corporate Author:

ILLINOIS UNIV AT URBANA DEPT OF COMPUTER SCIENCE

Personal Author(s):

Report Date:

1978-01-01

Pagination or Media Count:

10.0

Abstract:

We use a model that was first introduced by Preparata, Metze, and Chien. In this model, a digital system is partitioned into a certain number of units, each of which can be at one of two possible states, fault-free and faulty. A configuration of a system is an assignment of either the fault-free or the faulty state to each unit in the system. We assume that each unit in the system possesses a certain amount of computational resources to enable it to test is a binary signal which depends on the state of the testing and the tested units. In particular, we assume that 1 if a fault-free unit is tested by a fault-free unit, a signal 0 will be generated 2 if a faulty unit is tested by a fault-free unit, a signal 1 will be generated and 3 if a fault-free or a faulty unit is tested by a faulty unit, either a signal 0 or a signal 1 will be generated. In other words, the signal generated by a faulty testing unit is completely unreliable. A diagnosis experiment is one in which every unit tests all the units it is capable of testing once. The outcomes of the tests are referred to as a syndrome.

Subject Categories:

  • Statistics and Probability
  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE