On the Sequential Diagnosibility of a Class of Digital Systems,
ILLINOIS UNIV AT URBANA DEPT OF COMPUTER SCIENCE
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We use a model that was first introduced by Preparata, Metze, and Chien. In this model, a digital system is partitioned into a certain number of units, each of which can be at one of two possible states, fault-free and faulty. A configuration of a system is an assignment of either the fault-free or the faulty state to each unit in the system. We assume that each unit in the system possesses a certain amount of computational resources to enable it to test is a binary signal which depends on the state of the testing and the tested units. In particular, we assume that 1 if a fault-free unit is tested by a fault-free unit, a signal 0 will be generated 2 if a faulty unit is tested by a fault-free unit, a signal 1 will be generated and 3 if a fault-free or a faulty unit is tested by a faulty unit, either a signal 0 or a signal 1 will be generated. In other words, the signal generated by a faulty testing unit is completely unreliable. A diagnosis experiment is one in which every unit tests all the units it is capable of testing once. The outcomes of the tests are referred to as a syndrome.
- Statistics and Probability
- Computer Hardware