Accession Number:

ADA099999

Title:

Optimum Testing Procedures for System Diagnosis and Fault Isolation.

Descriptive Note:

Final rept. 1 Feb 80-31 Jan 81,

Corporate Author:

OKLAHOMA UNIV NORMAN SCHOOL OF INDUSTRIAL ENGINEERING

Personal Author(s):

Report Date:

1981-03-31

Pagination or Media Count:

88.0

Abstract:

Even though a great deal of work has been done in developing models in the field of designing diagnostic tests for fault isolation in digital systems, there is still a lack of efficient and fast procedures. Two approaches to the cost-effective design of fault isolation procedures were presented here. They were oriented specifically toward built-in-test BIT diagnostic subsystems for modular electronic equipment. A branch and bound solution approach was used in order to find the optimal sequence of tests to be executed by the BIT to isolate a single malfunctioned unit among a group of line replaceable units. Computational results were presented and discussed. A computer program listing of the solution technique was included. Author

Subject Categories:

  • Computer Programming and Software
  • Computer Hardware
  • Non-Radio Communications

Distribution Statement:

APPROVED FOR PUBLIC RELEASE