Electrical and Reliability Characterization of Schottky Power Diodes.
Final technical rept. Jan 79-Oct 80,
INTERNATIONAL RECTIFIER CORP EL SEGUNDO CALIF SEMICONDUCTOR DIV
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This program examined the barrier materials which were available in late 1978. Screening, electrical characterization and step stress testing were performed on six different processes power Schottky rectifiers. The proposed drafts of MIL-S-19500 detail specifications were prepared as part of this project. The data, proposed limits and related discussions are presented in this report. Author
- Electrical and Electronic Equipment
- Solid State Physics