Accession Number:

ADA091838

Title:

Detection of Aberrant Response Patterns and Their Effect on Dimensionality.

Descriptive Note:

Research rept. 21 Nov 79-20 Feb 80,

Corporate Author:

ILLINOIS UNIV AT URBANA-CHAMPAIGN COMPUTER-BASED EDUCATION RESEARCH LAB

Report Date:

1980-04-01

Pagination or Media Count:

58.0

Abstract:

An index measuring the degree to which a binary response pattern conforms to some baseline pattern was defined and named the Pattern Conformity Index PCI. By baseline pattern it is meant a binary response vector with all the 0s preceding the 1s when the items are arranged in descending order of difficulty or in some other, purposefully defined order.

Subject Categories:

  • Personnel Management and Labor Relations

Distribution Statement:

APPROVED FOR PUBLIC RELEASE