Accession Number:

ADA091372

Title:

RAM Technology Study.

Descriptive Note:

Topical rept. 1 Feb-31 Dec 79,

Corporate Author:

MISSION RESEARCH CORP LA JOLLA CA

Personal Author(s):

Report Date:

1980-01-03

Pagination or Media Count:

57.0

Abstract:

Electrical performance and radiation hardness parameters of modern RAM technologies were compared for consideration in military hardened system applications. Semiconductor technologies considered included production dynamic n-MOS, statis n-MOS, CMOS, bipolar ECL developing CMOSSOS and bipolar I2L. For the production technologies CMOS and bipolar ECL are clear candidates for hardened systems with limited application for static n-MOS and very limited application for dynamic n-MOS. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Hardware
  • Nuclear Radiation Shielding, Protection and Safety
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE