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New Techniques for Test Development for Tactical Autopilots Using Microprocessors,
BOEING AEROSPACE CO SEATTLE WA ENGINEERING TECHNOLOGY DIV
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This paper reports on a demonstration of the application of the method to generate system level tests for a typical tactical missile autopilot. The test algorithms are based on the autopilot control law. When loaded on the tester with appropriate control information, the complete autopilot is tested to establish if the specified control law requirements are met. Thus, the test procedure not only checks to see if the hardware is functional, but also checks the operational software. The technique also uses a learning mode to allow minor timing or functional deviations from the expected responses to be incorporated in the test procedures. A potential application of this test development technique is the extraction of production test data for the various subassemblies. The technique will learn the input-output patterns forming the basis for developement and production tests. If successful these new techniques should allow the test development process to keep pace with semiconductor progress.
APPROVED FOR PUBLIC RELEASE