Accession Number:

ADA090586

Title:

Microcircuit Device Reliability. Digital Evaluation and Failure Analysis Data. Parts 1 and 2, Summer 1980

Descriptive Note:

Corporate Author:

RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY

Personal Author(s):

• Nicholls, David B.

Report Date:

1980-01-01

Pagination or Media Count:

765.0

Abstract:

This compendium of digital SSIMSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.

Descriptors:

• *DIGITAL SYSTEMS
• *INTEGRATED CIRCUITS
• RATES
• SEMICONDUCTORS
• REPLACEMENT
• HYBRID SYSTEMS
• LIFE TESTS
• MICROCIRCUITS
• RELIABILITY(ELECTRONICS)
• FAILURE(ELECTRONICS)

Subject Categories:

• Electrical and Electronic Equipment
• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE