DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click HERE
to register or log in.
Microcircuit Device Reliability. Digital Evaluation and Failure Analysis Data. Parts 1 and 2, Summer 1980
RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY
Pagination or Media Count:
This compendium of digital SSIMSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.
APPROVED FOR PUBLIC RELEASE