Accession Number:

ADA089112

Title:

Nuclear Radiation Effects Data on Large Scale Integrated Circuits.

Descriptive Note:

Data summary,

Corporate Author:

HARRY DIAMOND LABS ADELPHI MD

Report Date:

1980-07-01

Pagination or Media Count:

84.0

Abstract:

This summary tabulates nuclear radiation effects data on large scale integrated LSI circuits. It is intended to be a handy reference to help engineers select components for systems that must survive a given radiation level or evaluate the radiation hardness of previously designed systems. Most of the data in this report were compiled from papers presented at the Annual IEEE Conference on Nuclear and Space Radiation Effects 1971 through 1979. The remainder came from a variety of government and industry reports. Due to the complexity of testing procedures of LSI devices and the space constraints of a tabular format, not all pertinent data can be presented in this summary. We have attempted to give most of the data needed for assessing the hardness of a given component. The balance of the information can be found in the references.

Subject Categories:

  • Electrical and Electronic Equipment
  • Nuclear Radiation Shielding, Protection and Safety
  • Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE