A Study of Secondary Ion Triple Bond Analogues.
Interim technical rept.,
CORNELL UNIV ITHACA NY DEPT OF CHEMISTRY
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Diatomic molecular ions isoelectronic with CN have been generated in ion implanted semiconductor materials and analyzed using secondary ion mass spectrometry SIMS. Negative IVA-VA ions containing the VA species from IVA implanted IIIA-VA semiconductors are found to be produced more readily than the IVA ions. The triple bond analogues studied were of the general type IVA-VA, IIIA-VIA -, VA-VIA and IVA-VIIA. Molecular ion formation mechanisms and the analytical consequences of the results of this study are discussed. Author
- Atomic and Molecular Physics and Spectroscopy
- Solid State Physics