Accession Number:

ADA083201

Title:

Data Treatment in Electron and Ion Spectroscopy.

Descriptive Note:

Interim rept. Jul 77-Jul 79,

Corporate Author:

AIR FORCE MATERIALS LAB WRIGHT-PATTERSON AFB OH

Personal Author(s):

Report Date:

1979-12-01

Pagination or Media Count:

20.0

Abstract:

In order to fully utilize newly developed electron and ion surface spectroscopies, the data from these methods must be treated carefully to assure quality and clarity both during and after the experiment. Signal conditioning during the experiment puts the data into proper form for recording and may include steps for amplifying, digitizing, discriminating, modulating, gating, transforming and filtering. In Auger Electron Spectroscopy AES where modulation and synchronous detection methods are used, special tailored waveform modulation may be necessary to minimize elemental profile artifacts. Dynamic background subtraction, digital filtering and Fourier transforms improve the signal to noise ratio and facilitate further data processing. If possible, an entire spectrum should be digitally stored at each plotted point on the elemental depth profile. Such spectral storage allows retrieval and examination of the spectrum for peak shape changes or appearance of peaks which were not expected to occur. A point which must be considered is that in bulk spectroscopies we may accumulate signal for whatever period is necessary to obtain desired counting statistics while in surface spectroscopies using an ion beam such as ISS and SIMS, the eroding surface is ever changing and only a finite time is available for counting at a given depth.

Subject Categories:

  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE