Microcircuit Device Reliability Hybrid Circuit Data, Winter 1979/1980
IIT RESEARCH INST ROME NY
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This compendium of Hybrid Microcircuit Reliability Data contains both detailed and summarized information. The detailed data have been collected from both military and commercial applications and consist of field experience, reliability demonstration results, screening fallout, life tests, and equipment check-out results. A full description of the construction of each device as well as the manufacturer and all test parameters have been included. The summarized data show the distribution of failure causes for hybrids subjected to various conditions, failure rates of components used within hybrids, the screening fallout distributions and a comparison between field data and MIL-HDBK-217 predictions.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems