Discrete Semiconductor Reliability Transistor/Diode Data, Winter 79/80,
IIT RESEARCH INST ROME NY
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This Discrete Semiconductor Reliability compendium contains failure rates on transistors and diodes from actual field use conditions, in-house checkout and reliability tests performed at the equipment level. Generic part- type failure rate summaries and a reliability data tabulation by E.I.A.- registered part number are presented. The failures reported are described in a separate section which includes detailed failure analysis information.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems