Accession Number:

ADA083037

Title:

Discrete Semiconductor Reliability Transistor/Diode Data, Winter 79/80,

Descriptive Note:

Corporate Author:

IIT RESEARCH INST ROME NY

Personal Author(s):

Report Date:

1980-01-01

Pagination or Media Count:

417.0

Abstract:

This Discrete Semiconductor Reliability compendium contains failure rates on transistors and diodes from actual field use conditions, in-house checkout and reliability tests performed at the equipment level. Generic part- type failure rate summaries and a reliability data tabulation by E.I.A.- registered part number are presented. The failures reported are described in a separate section which includes detailed failure analysis information.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE