Effects of Random Shading, Phasing Errors, and Element Failures on the Beam Patterns of Line and Planar Arrays.
NAVAL UNDERWATER SYSTEMS CENTER NEW LONDON CT NEW LONDON LAB
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The effects of random shading, phasing errors, and element failures on the beam patterns of line and planar arrays are investigated. The results indicate that the effects of element failures and random phasing errors on the beam pattern are more pronounced than the effect of shading errors. The deep side lobe level, in both line and planar arrays, is critically affected by random errors that include shading, phasing, and element failures. The combined effect of random shading, phase, and element failures on the beam pattern of a line array is more dramatic than it is on the beam pattern of a planar array. Author
- Acoustic Detection and Detectors