Reliability Test and Evaluation of MIL-M-38510 Linear Microcircuits
Final technical rept. Jul 1976-Nov 1978
MCDONNELL DOUGLAS ASTRONAUTICS CO ST LOUIS MO
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The objective of this effort is to provide analysis and evaluation of high reliability linear microcircuits to assure adequate test methods, reliability prediction and specification for high reliability Air Force Electronics. Data from this effort including processing information, materials, design characteristics, electrical measurements, temperature coefficients, stabilities, application information, test methods, burn-in procedures, specification, and reliability data will be used by the Government to assure high reliability in systems using these devices.
- Electrical and Electronic Equipment