Accession Number:

ADA073455

Title:

Reliability Test and Evaluation of MIL-M-38510 Linear Microcircuits

Descriptive Note:

Final technical rept. Jul 1976-Nov 1978

Corporate Author:

MCDONNELL DOUGLAS ASTRONAUTICS CO ST LOUIS MO

Personal Author(s):

Report Date:

1979-07-01

Pagination or Media Count:

380.0

Abstract:

The objective of this effort is to provide analysis and evaluation of high reliability linear microcircuits to assure adequate test methods, reliability prediction and specification for high reliability Air Force Electronics. Data from this effort including processing information, materials, design characteristics, electrical measurements, temperature coefficients, stabilities, application information, test methods, burn-in procedures, specification, and reliability data will be used by the Government to assure high reliability in systems using these devices.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE