Electrical Overstress Program.
ARMY MISSILE RESEARCH AND DEVELOPMENT COMMAND REDSTONE ARSENAL AL ADVANCED SYSTEMS DEV/MFG TECH DIRECTORATE
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This report is a description of initial work on a program to provide information needed in the development of a nondestructive screen to eliminate junction bipolar devices especially suspectible to damage after second breakdown. Based on the results of the first 8 months of work, the decision has been made that the major thrust of the program should be towards identifying the reasons why specific samples of a given device type are unusually susceptible, rather than determining nominal susceptibility of generic types.
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods