Accession Number:

ADA071794

Title:

Long-Term Dormant Storage of Microelectronic Components.

Descriptive Note:

Interim rept. 8 Aug 77-28 Feb 78,

Corporate Author:

EX-CAL INC ALBUQUERQUE NM R/M SYSTEMS DIV

Personal Author(s):

Report Date:

1979-07-01

Pagination or Media Count:

56.0

Abstract:

An analysis is presented of the long-term dormant storage test data experimentally accumlated on two microelectronic devices. All relevant information on the experimental test program was reviewed very carefully. The existence of error sources, anomalous data, and data acquisition discontinuities was identified. The unanticipated final result of the analysis was that the data collected was of an insufficient quality to enable the identification of any aging behavior as a function of time, temperature, or operational stress. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE