Search and Retrieval Index to IRPS Proceedings - 1968 to 1978.
Technical reliability study,
ITT RESEARCH INST CHICAGO IL RELIABILITY ANALYSIS CENTER
Pagination or Media Count:
The major source of information on reliability physics phenomena of electron devices is the Annual Proceedings of the International Reliability Physics Symposium IRPS. The indexes contained herein cover the ten IRPS proceedings from 1968 7th Annual to 1978 16 Annual. The purpose of this index is to make more accessible present information on failure mechanisms, along with reported recommendations for circumventing or miti-gating potential reliability problems. References to failure analysis techniques, evaluation, and qualification testing are also provided. Duplication of previous studies and unreliable processes can be avoided by the increased information retrieval capability provided by this index. Author
- Manufacturing and Industrial Engineering and Control of Production Systems