Advanced Archival Memory
Interim rept. no. 6, 1 Jan-1 Jul 1978
GENERAL ELECTRIC CORPORATE RESEARCH AND DEVELOPMENT SCHENECTADY NY
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This report covers the effort for the first eight months of 1978. The contract has been redirected from the ion damage writing concept to one based on electron beam milling of thin layers of selenium-arsenic on silicon diode detectors. Background surrounding the redirection can be found in the introduction. Work in the reporting period has concentrated on evaluating two all-electron beam storage concepts alloy junction and electron beam milling. The electron beam milling approach has been chosen, and an advanced high current electron probe is being purchased for use in evaluating this storage concept.
- Fabrication Metallurgy
- Computer Hardware