High Accuracy Microwave S-Parameter Measurements on Solid State Devices.
NAVAL RESEARCH LAB WASHINGTON DC
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The absolute accuracy of automatic network analyzer measurement and de-imbedding of microwave S-parameters of solid state devices diodes or transistors is not easy to determine. A reasonable rule of thumb is that the fewer inaccurate measurements necessary to get at an answer, the more accurate the answer. The method outlined in this report, especially the low VSWR test equipment case which uses only one measurement other than the one with the device in place, uses fewer measurements than any other method known. Because of this it is also possible that this measurement and de-imbedding method is the most accurate. Author
- Electrical and Electronic Equipment
- Electricity and Magnetism