A Survey of LSI Test Methodology.
Final technical rept. Jul 77-Sep 78,
CLARKSON COLL OF TECHNOLOGY POTSDAM N Y
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This report discusses different test methods available for testing Logic Circuits and Large Scale Integrated Circuits LSI from Structural, Functional and Random testing viewpoints. Many test schemes have been proposed in the literature and this report attempts to classify the different test schemes into two basic approaches, nmemely, test generation and test application. An attempt is also made to indicate the philosophy underlying different test equipment. The report also incorporates a brief introduction to digital testing which should enable engineers unfamilar with the concepts of digital testing to read this report with minimum external references. Author
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods