Production Measurement of Fuze Components under Dynamic Stress.
Final rept. 11 May 76-31 Dec 78,
LOCKHEED ELECTRONICS CO INC DENVILLE NJ
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A dynamic test and correction system was designed and partially developed which is capable of high-speed testing and laser-trimming electronic assemblies. The circuits selected for tester verification were the oscillator and amplifier assemblies of the M732 Fuze. Program goals required that a selected critical property of each assembly be set to a or - 0.5 percent tolerance at an average test and trim rate of 3000 units per hour excluding mechanical handling. The system was designed to measure fundamental properties of modified amplifier assemblies, calculate height of burst, and automatically laser trim a thick-film resistor to adjust this property to a precise value. Oscillator assemblies were adjusted for sensitivity by trimming one of two ceramic chip capacitors. Height of Burst or sensitivity was calculated in real-time using a combination of black box equivalent circuit andor circuit model representations of individual test unit stages. Pre-calculated look-up tables were introduced where complex time-consuming calculations were required.
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