Accession Number:

ADA064847

Title:

ICCD Electron Damage Investigation.

Descriptive Note:

Final rept. 1 Apr 77-24 Jul 78,

Corporate Author:

ELECTRONIC VISION CO SAN DIEGO CA

Personal Author(s):

Report Date:

1978-07-24

Pagination or Media Count:

89.0

Abstract:

The operational lifetime of an Intensified Charge Coupled Device ICCD utilizing a front-illuminated Fairchild CCD202 to detect photoelectrons has been evaluated for operating conditions anticipated in space applications. Under electron bombardment, the CCD exhibited severe increases in dark current and reduction in responsivity after detecting approximately 10 to the 6th power electrons per pixel, which corresponds to a lifetime of about 10 hours. In an effort to extend the lifetime of front-irradiated CCDs, parametric studies of the effects of electron energy, operating temperature of the CCD, clock voltages, and annealing thermal, UV, and electron-bombardment were performed. The only technique which can significantly extend the lifetime of the presently available front-illuminated Fairchild CCD202 type device appears to be to sequentially utilize different segments of the array. Perhaps an order of magnitude increase in lifetime could be obtained in this manner. A survey of other CCD radiation damage work suggested two techniques which could significantly increase ICCD lifetime.

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Optical Detection and Detectors

Distribution Statement:

APPROVED FOR PUBLIC RELEASE