Accession Number:

ADA064844

Title:

Optical Bi-Refringent Technique in Defect Characterization.

Descriptive Note:

Final rept. 1 Mar 77-30 Sep 78,

Corporate Author:

IBM THOMAS J WATSON RESEARCH CENTER YORKTOWN HEIGHTS N Y

Personal Author(s):

Report Date:

1978-11-30

Pagination or Media Count:

36.0

Abstract:

Defects in GaP, Garnets, and Si have been examined and characterized by stress induced optical bi-refringence. This technique is explored in examining devices and it is suggested that its utility lies in the early stages of device fabrication rather than towards the end. Author

Subject Categories:

  • Crystallography
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE