Microcircuit Device Reliability. Digital Evaluation and Generic Failure Analysis Data,
IIT RESEARCH INST ROME NY
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This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmentalscreening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analysesFMECA. Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems