Accession Number:

ADA064418

Title:

Electrical Characterization of GaAs Anodic Oxides Using Isothermal Dielectric Relaxation Current.

Descriptive Note:

Master's thesis,

Corporate Author:

AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Personal Author(s):

Report Date:

1978-12-01

Pagination or Media Count:

79.0

Abstract:

The theory and practical limitations of the IDRC technique of Mar and Simmons are discussed. An improved version of the original experiment that incorporates digital processing of the data is described. Results were obtained for Si and used to establish confidence in the new procedure. Anodic oxides of GaAs were then studied, and the results indicate that there are large densities of both fixed and mobile trap states at and near the interface. The mobile trap states behave as though negatively charged. Author

Subject Categories:

  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE