Accession Number:

ADA061309

Title:

Radiation Effects on Charge-Coupled Devices and other MOS Structures.

Descriptive Note:

Final rept. May 77-Apr 78,

Corporate Author:

NORTHROP RESEARCH AND TECHNOLOGY CENTER PALOS VERDES PENINSULA CA

Report Date:

1978-10-01

Pagination or Media Count:

179.0

Abstract:

This report describes results of radiation effects studies on charge-coupled devices CCDs and other MOS structures. Emphasis is placed on determining the basic mechanisms of the interaction of radiation with such devices with a view toward gaining understanding of benefit to developers of radiation-tolerant devices. A study of neutron damage mechanisms in CCDs was performed with emphasis placed on investigation of dark current increases.

Subject Categories:

  • Radioactivity, Radioactive Wastes and Fission Products
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE