Accession Number:

ADA058791

Title:

A Pattern Deformational Model and Bayes Error-Correcting Recognition System.

Descriptive Note:

Interim rept.,

Corporate Author:

PURDUE UNIV LAFAYETTE IND SCHOOL OF ELECTRICAL ENGINEERING

Personal Author(s):

Report Date:

1978-05-01

Pagination or Media Count:

43.0

Abstract:

Various types of pattern deformations are investigated from the syntactic point of view and categorized into two major types local deformations and structural deformations. Random noise, distortion variations, and substitutions, of pattern primitives belong to the former syntactic errors due to pattern structural changes, such as primitive deletions and insertions, belong to the latter. Every observed pattern can be regarded as transformed from a pure pattern through these two types of deformations. An error-correcting parsing scheme for local deformations optimum in the Bayes sense is proposed. Two structure-preserved error-correcting parsers, one for string languages, the other tree languages, are also presented. Finally, further researches concerning error-correcting parsings for structural deformations and a complete error-correcting systems for both kinds of deformations are suggested.

Subject Categories:

  • Computer Programming and Software
  • Cybernetics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE