Accession Number:

ADA058393

Title:

Microcircuit Device Reliability. Digital Failure Rate Data,

Descriptive Note:

Corporate Author:

ITT RESEARCH INST CHICAGO IL RELIABILITY ANALYSIS CENTER

Personal Author(s):

Report Date:

1978-01-01

Pagination or Media Count:

344.0

Abstract:

This compendium of microcircuit device reliability is separated into two parts Digital Failure Rate Summarized Data and Digital Device Data - Detailed Listings. The summaries pertain to warranty experience, plastic encapsulated I.C. lot acceptance information, and generic field, reliability demonstration, equipment checkout and life test data. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE