Accession Number:

ADA058093

Title:

Comparison Study of the Five Transistor-Transistor-Logic (TTL) Families and Emitter Coupled Logic (ECL).

Descriptive Note:

Final rept.,

Corporate Author:

AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX

Personal Author(s):

Report Date:

1978-05-01

Pagination or Media Count:

93.0

Abstract:

This report describes the radiation test response of the five transistor-transistor-logic TTL technologies and the emitter-coupled-logic ECL technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND TTL or NOR ECL gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technologys radiation response. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Nuclear Radiation Shielding, Protection and Safety

Distribution Statement:

APPROVED FOR PUBLIC RELEASE