Comparison Study of the Five Transistor-Transistor-Logic (TTL) Families and Emitter Coupled Logic (ECL).
AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX
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This report describes the radiation test response of the five transistor-transistor-logic TTL technologies and the emitter-coupled-logic ECL technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND TTL or NOR ECL gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technologys radiation response. Author
- Electrical and Electronic Equipment
- Nuclear Radiation Shielding, Protection and Safety