Microcircuit Reliability Bibliography. Volume I-C. Cumulative Index.
ITT RESEARCH INST CHICAGO IL RELIABILITY ANALYSIS CENTER
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This bibliography identifies selected literature pertinent to the reliability of microelectronic devices. Volume IC contains a categorized subject term index, corporate author, personal author and document title-keyword in context indices.
- Information Science
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems