MM and T Program to Establish Production Techniques for the Automatic Detection and Qualification of Trace Elements Present in the Production of Microwave Semiconductors.
Quarterly rept. no. 2, 23 Nov 77-28 Feb 78,
HARRIS CORP SYOSSET NY PRD ELECTRONICS DIV
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A project was undertaken to improve the yield in the manufacture of microwave semiconductor diodes by establishing the correlation of product yields to the incidence of contaminants in the reagents and solvents used in the manufacturing process and using these data to model the process for optimization of the yield. Author
- Electrical and Electronic Equipment