Accession Number:

ADA056957

Title:

MM and T Program to Establish Production Techniques for the Automatic Detection and Qualification of Trace Elements Present in the Production of Microwave Semiconductors.

Descriptive Note:

Quarterly rept. no. 2, 23 Nov 77-28 Feb 78,

Corporate Author:

HARRIS CORP SYOSSET NY PRD ELECTRONICS DIV

Personal Author(s):

• Spacie,Roy W.

Report Date:

1978-02-01

Pagination or Media Count:

71.0

Abstract:

A project was undertaken to improve the yield in the manufacture of microwave semiconductor diodes by establishing the correlation of product yields to the incidence of contaminants in the reagents and solvents used in the manufacturing process and using these data to model the process for optimization of the yield. Author

Descriptors:

• *MICROWAVE EQUIPMENT
• *SEMICONDUCTOR DIODES
• MATHEMATICAL MODELS
• DATA PROCESSING
• INDUSTRIAL PRODUCTION
• PERFORMANCE(ENGINEERING)
• ELECTRICAL PROPERTIES
• IMPURITIES
• PRODUCTION CONTROL
• YIELD
• INSTRUMENTATION
• CONTAMINANTS
• COMPUTER APPLICATIONS
• EMISSION SPECTROSCOPY
• TRACE ELEMENTS

Subject Categories:

• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE