Automated Test Design.
Final rept. 30 Jun 75-31 Aug 77,
MOORE SCHOOL OF ELECTRICAL ENGINEERING PHILADELPHIA PA DEPT OF COMPUTER AND INFORMATION SCIENCES
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A methodology for designing tests to diagnose and isolate failures in analog circuits has been developed and implemented as a computer program. The input to the program consists of a circuit description and a list of possible failures as changes to the nominal unit under test. The output of the program consists of a report showing how well the failures can be isolated, the tests to be performed, and the diagnosis selection logic which combines these tests to isolate the faulty components. The final output is produced in the NOPAL nonprocedural OPAL test specification language. Author
- Computer Programming and Software