A Study of a Standard BIT Circuit.
Final technical rept.,
RESEARCH TRIANGLE INST RESEARCH TRIANGLE PARK NC SYSTEMS INSTRUMENTATION DEPT
Pagination or Media Count:
The desirability of reducing life cycle costs of complex digital systems is obvious. The mechanisms for accomplishing this reduction and the approaches to seeking these mechanisms are not so obvious. One approach which has been successfully taken by the Navy is to utilization of standard modular hardware to minimize equipment sparing costs by reducing the number and types of modules spared. In addition, the use of modular digital hardware on mobile weapon platforms having long duration missions precludes access to large spare equipment inventories e.g., ballistic missile submarines. Utilization of modular digital hardware in such cases allows equipment repair to be promptly effected and thereby increases system availability. Thus the Navy standard modular hardware program such as the Standard Electronic Module SEM program lead directly to life cycle cost reduction and increased system availability. The overall objective of this work is to explore ways to further reduce digital system life cycle cost and increase system availability through improved fault detection and isolation techniques. The particular approach taken in this study involves the use of built-in-test BIT circuits at the replaceable unit level to facilitate fault detection and isolation.
- Test Facilities, Equipment and Methods