Accession Number:

ADA053899

Title:

Component Damage from Electromagnetic Pulse (EMP) Induced Transients.

Descriptive Note:

Technical memo.,

Corporate Author:

HARRY DIAMOND LABS ADELPHI MD

Personal Author(s):

Report Date:

1977-10-01

Pagination or Media Count:

184.0

Abstract:

The Lance Vulnerability and Hardening Test Program was supported by a number of in-laboratory experiments on various component types. Of prime concern was the establishment of component EMP thresholds to be used in establishing the vulnerability level of the system. Reported are pulsed transient tests on over 50 component types. Testing concentrated on sensitive semiconductor components, and about 1800 individual devices were damage tested. The tests used rectangular pulses varying in width from 5 ns to 30 micros. Numerous nonsemiconductor components also were characterized. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Test Facilities, Equipment and Methods
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE