Storage Reliability of Missile Materiel Program, Monolithic Bipolar SSI/ MSI Digital and Linear Integrated Circuit Analysis
Final rept. Jun 1974-Jan 1978
RAYTHEON CO HUNTSVILLE AL LIFE CYCLE ANALYSIS GROUP
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This report documents findings on the non-operating reliability of monolithic bipolar SSIMSI digital and linear integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems
- Guided Missiles