Accession Number:

ADA053405

Title:

Storage Reliability of Missile Materiel Program. Storage Reliability Analysis Summary Report. Volume 1. Electrical and Electronic Devices

Descriptive Note:

Final rept. Jun 1974-Jan 1978

Corporate Author:

RAYTHEON CO HUNTSVILLE AL LIFE CYCLE ANALYSIS GROUP

Personal Author(s):

Report Date:

1978-01-01

Pagination or Media Count:

333.0

Abstract:

This report summarizes analyses on the non-operating reliability of missile electrical and electronic devices. The analyses are part of a research program being conducted by the U. S. Army Missile R and D Command, Redstone Arsenal, Alabama. The objective of the program is the development of non-operating storage reliability prediction and assurance techniques for missile materiel. Included are analyses of integrated circuits, semiconductors, vacuum tubes, resistors, capacitors, inductive Devices, crystals, batteries connections, connectors and printed wiring boards. This report updates and replaces report LC-78-2 dated May 1976.

Subject Categories:

  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Guided Missiles

Distribution Statement:

APPROVED FOR PUBLIC RELEASE