Accession Number:

ADA051151

Title:

Reliability Factors for Electronic Components in a Storage Environment

Descriptive Note:

Final rept. 21 Apr 1975-31 Jul 1977

Corporate Author:

GEORGIA INST OF TECH ATLANTA APPLIED SCIENCES LAB

Personal Author(s):

Report Date:

1977-09-01

Pagination or Media Count:

248.0

Abstract:

The long-term storage reliability of electronic components in U.S. Army missile systems is approached from the viewpoint of materials degradation phenomena. A survey of missile systems is made to illustrate the wide range of tactical missiles and the different electronic technologies used. Data on world- wide environments, particularly temperature variations, are included to indicate the nature of storage environmental stresses acting on the missile and its electronic components. Failure processes resulting from these environmental stresses are discussed in terms of mechanical, thermal-mechanical, chemical and thermal effects. Further specific discussions are included on hermeticity, polymers, oxides and statistics. The conclusions and recommendations include several items which suggest changes in component reliability policies and recommendations are made for future research efforts in storage reliability. An extensive bibliography is included.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Guided Missile Launching and Basing Support
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE