Accession Number:

ADA050476

Title:

Radiation Characterization of Sequential Logic Circuits.

Descriptive Note:

Final rept.,

Corporate Author:

AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX

Personal Author(s):

Report Date:

1978-01-01

Pagination or Media Count:

51.0

Abstract:

This report describes the test techniques for radiation characterizing medium and large-scale integration MSILSI sequential logic circuits where few internal nodes are available for testing. Four sequential logic devices, two transistor-transistor-logic TTL technology devices and two complementary-metal-oxide-silicon CMOS technology devices were characterized. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to determine the applicability of the testing techniques and procedures. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Nuclear Radiation Shielding, Protection and Safety

Distribution Statement:

APPROVED FOR PUBLIC RELEASE